Polycrystalline silicon block material picking method and device
The invention discloses a polycrystalline silicon block material picking method. The method comprises the following steps of acquiring an image of a block material; comparing the image of the block material with a standard block material, and judging whether the block material is a qualified block m...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a polycrystalline silicon block material picking method. The method comprises the following steps of acquiring an image of a block material; comparing the image of the block material with a standard block material, and judging whether the block material is a qualified block material or not according to a comparison result; and placing the block material judged to be unqualified in an abnormal material box. Correspondingly, the invention further provides a polycrystalline silicon block material picking device. According to the picking method, the picking identification degree can be improved, and the picking efficiency is improved.
本发明公开一种多晶硅块料的挑拣方法,包括:获取块料的图像;将块料的图像与标准块料进行比对,并根据比对结果判断块料是否为合格块料;将判断为不合格块料放置在异常料盒中。相应的,本发明还提供一种多晶硅块料的挑拣装置。该挑拣方法能够提高挑拣辨识度,并提高挑拣效率。 |
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