METHOD FOR ASCERTAINING MEASUREMENT VALUES USING AT LEAST TWO DIFFERENT MEASUREMENT METHODS, AND USE THEREOF

The invention relates to a method for ascertaining measurement values (MW1, MW2, KMW) using at least two different measurement methods (MV1, MV2). According to the invention, temporary measurement values (MW1, MW2) are ascertained using each measurement method (MV1, MV2), and information on the inte...

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Bibliographische Detailangaben
Hauptverfasser: RIES FLORIAN, SCHUSTER FRANK, HAUEIS MARTIN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a method for ascertaining measurement values (MW1, MW2, KMW) using at least two different measurement methods (MV1, MV2). According to the invention, temporary measurement values (MW1, MW2) are ascertained using each measurement method (MV1, MV2), and information on the integrity (IMW1, IMW2) of the ascertained temporary measurement values (MW1, MW2) is provided. The ascertained temporary measurement values (MW1. MW2) are fused into combined measurement values (KMW), and information on the integrity (KIMW) of the combined measurement values (KMW) is ascertained. The decision as to which of the measurement values (MW1, MW2, KMW) are provided for further processing is made on the basis of the information on the integrity (IMW1, IMW2, KMW) of the ascertained temporary measurement values (MW1, MW2) and the combined measurement values (KMW) and on the basis of a time period during which each of the ascertained temporary measurement values (MW1, MW2) and the combined measurement values (KMW