Label influence degree calculation method and system based on exponential decay
The invention provides a label influence degree calculation method and system based on exponential decay, and relates to the technical field of network security. The method includes sorting all label historical data to form sequence data in a fixed format; respectively calculating a preliminary infl...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a label influence degree calculation method and system based on exponential decay, and relates to the technical field of network security. The method includes sorting all label historical data to form sequence data in a fixed format; respectively calculating a preliminary influence degree and a frequency penalty term factor based on time by using an exponential decay function; multiplying the preliminary influence degree and the frequency penalty factor and then summing same; and obtaining a label influence degree through a sidmoid function. According to the invention, a layered calculation scheme is provided for calculation of the influence degree of the label, the absolute value evaluation of the influence degree based on the evaluated label historical data is realized, the method does not depend on the total label historical data, and the availability is relatively high. According to the invention, the influence degree of the label can be reasonably and effectively calculated through |
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