Optical test method and system for diaphragm thickness
The invention discloses an optical test method and system for diaphragm thickness, and belongs to the technical field of loudspeakers. The optical test method comprises the steps: obtaining the vertex position information of a center ball top of a diaphragm; obtaining light position information of a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an optical test method and system for diaphragm thickness, and belongs to the technical field of loudspeakers. The optical test method comprises the steps: obtaining the vertex position information of a center ball top of a diaphragm; obtaining light position information of a light emitting device; calculating an offset according to the vertex position information and the light position information; obtaining a detection signal of a light receiving device, and obtaining the initial thickness of the diaphragm according to the detection signal; and calculating the final thickness of the diaphragm according to the offset and the initial thickness. The method and system of the invention have the effect of improving the accuracy of diaphragm thickness detection.
本申请公开了一种膜片厚度的光测试方法及系统,属于扬声器技术领域,光测试方法包括:获取膜片中心球顶部的顶点位置信息;获取光发射装置的光位置信息;根据顶点位置信息和光位置信息计算得到偏移量;获取光接收装置的检测信号,并根据检测信号得到膜片的初步厚度;根据偏移量和初步厚度计算得到膜片的最终厚度,本申请具有提高膜片厚度检测的精准度的效果。 |
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