Heterojunction bipolar transistor

The present disclosure relates to semiconductor structures and, more particularly, to heterojunction bipolar transistors and methods of manufacture. The structure includes: a first semiconductor layer including a device region; a second semiconductor layer under the first semiconductor layer; a laye...

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Bibliographische Detailangaben
Hauptverfasser: STAMPER ANTHONY K, KANTAROVSKY JOHNATAN A, HUANG JIANMIN, ALDRIDGE JR HENRY L
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The present disclosure relates to semiconductor structures and, more particularly, to heterojunction bipolar transistors and methods of manufacture. The structure includes: a first semiconductor layer including a device region; a second semiconductor layer under the first semiconductor layer; a layer of conductive material between the first semiconductor layer and the second semiconductor layer; at least one contact extending to and contacting the layer of conductive material; and a device in the device region above the layer of conductive material. 本公开涉及半导体结构,更具体地涉及异质结双极型晶体管及制造方法。该结构包括:第一半导体层,其包括器件区域;第二半导体层,其位于第一半导体层下方;导电材料层,其位于第一半导体层和第二半导体层之间;至少一个接触,其延伸到导电材料层并与导电材料层接触;以及器件,其位于导电材料层上方的器件区域中。