Scanning method, device and system based on total station

The invention provides a scanning method, device and system based on a total station, and relates to the technical field of total station scanning. The method comprises the following steps: establishing a theoretical model database; collecting feature points capable of defining geometric features of...

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Bibliographische Detailangaben
Hauptverfasser: CHEN LEI, LIN MEIKUN, ZHENG TIANLI, LIU DAWEI, SHEN JIAYONG, ZHANG JIAN, LI BAI, HUANG TAORUI, MA GAOFENG, WU JINGJING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a scanning method, device and system based on a total station, and relates to the technical field of total station scanning. The method comprises the following steps: establishing a theoretical model database; collecting feature points capable of defining geometric features of the to-be-measured entity through the total station, and obtaining measurement data of the geometric feature points of the to-be-measured entity; and fitting the measurement data of the geometric feature points of the to-be-measured entity with the corresponding theoretical model database to determine the spatial position information of the nodes of the to-be-measured entity. According to the technical scheme, the theoretical model database is established, the total station is used for collecting the feature points capable of defining the geometric features of the to-be-measured entity, and the measurement data of the geometric feature points of the to-be-measured entity and the corresponding theoretical model dat