Rapid and high-precision measurement method for deep hole inner section contour features
The invention belongs to the technical field of geometric quantity precision measurement based on machine vision, and provides a rapid and high-precision measurement method for deep hole inner section contour features. An annular laser emits stable annular structure light, and a convex lens aggregat...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the technical field of geometric quantity precision measurement based on machine vision, and provides a rapid and high-precision measurement method for deep hole inner section contour features. An annular laser emits stable annular structure light, and a convex lens aggregates the discrete annular structure light into parallel light; a triangular imaging lens group is used for constructing a mapping relation between deep hole inner section contour features and an image annular structure light center, performing high-precision calibration on a space mapping relation between small hole geometric parameters and image coordinates, amplifying the inner section contour features and improving high-resolution acquisition of the features in the hole; a right-angle prism vertically redirects the parallel light output by the triangular imaging lens group; an magnifying lens group optically magnifies the parallel light; an industrial camera receives the output parallel light information and obtai |
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