Needle inserting height self-adjusting system and method

The invention provides a needling height self-adjusting system and method. The method comprises the steps of obtaining relative position of a probe tip and a chip; when the distance between the probe tip and the chip is smaller than a pre-contact distance, controlling a chip bearing table to move step by step relative to a probe card, and testing the chip after each movement to obtain test data; and when the test data are valid, determining that the current position of the chip bearing table or the chip is a first contact position, and finely controlling the chip bearing table to rise by a preset height to enable the chip bearing table to reach a second contact position. According to the invention, human intervention in the chip test process can be reduced, and the influence on the chip test caused by improper operation of an operator in the process of adjusting the insertion height of the probe is avoided. 本发明提供了一种扎针高度自调整系统及方法，获取探针尖与芯片的相对位置；当所述探针尖与芯片之间的距离小于预接触距离后，控制承片台相对于所述探针卡逐级运动，每次运动后进行芯片测试，获取测试数据；当测试数据有效时