Optical system for measuring refraction information

The invention discloses an optical system for measuring refraction information, which is characterized in that a first optical component generates a light beam and emits the light beam to a reflecting surface, the reflecting surface is used for reflecting the light beam emitted by the first optical...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HU BING, LIU XI, JIANG YANGJUN
Format: Patent
Sprache:chi ; eng
Schlagworte:
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