Optical system for measuring refraction information
The invention discloses an optical system for measuring refraction information, which is characterized in that a first optical component generates a light beam and emits the light beam to a reflecting surface, the reflecting surface is used for reflecting the light beam emitted by the first optical...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an optical system for measuring refraction information, which is characterized in that a first optical component generates a light beam and emits the light beam to a reflecting surface, the reflecting surface is used for reflecting the light beam emitted by the first optical component to project the light beam to a measured object, and the reflecting surface rotates to enable the light beam to irradiate the measured object to move; and the second optical component converges the light beams reflected by the measured object and performs imaging, so that the light beams reflected by different positions of the measured object are superposed on the same imaging result, and refraction information of the measured object is obtained according to the imaging result. Through rotation of the reflecting surface, the light beams are reflected at different positions of the measured object, the phases of the light beams reflected by the different positions of the measured object are different, and th |
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