NONCONTACT SENSOR CALIBRATION USING SINGLE AXIS MOVEMENT

A probe calibration method and calibration artifact (30, 70) whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (40). The method includes a plurality of calibration spheres fixed in relation to one...

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Bibliographische Detailangaben
Hauptverfasser: SHEPHERD ETHAN JAMES, WAGAJ PARAG P
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A probe calibration method and calibration artifact (30, 70) whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (40). The method includes a plurality of calibration spheres fixed in relation to one another via a rigid structure comprising a calibration artifact body (30, 70). The spheres are mounted such that each will be sensed by the probe at some position of a machine axis (W, N). In other words, the spheres lie in the region swept out by the sensor field of view (8, 78) over the movement of the machine axis. The calibration spheres are located at known positions (A, B, C) and the calibration artifact body is designed such that it may be mounted in a known location in place of a work piece. 一种探头校准方法和一种校准制品(30,70),其中可在不使用能够相对于校准球体(40)对探头进行三维定位的机器轴线的情况下执行校准。所述方法包含通过包括校准制品主体(30,70)的刚性结构相对于彼此固定的多个校准球体。所述球体被安装成使得将在机器轴线(W,N)的某一位置处由所述探头感测到每一球体。换句话说,所述球体位于由传感器视场(8,78)在所述机器轴线的移动范围内扫掠出的区中。所述校准球体位于已知位置(A,B,C)处,且所述校准