Hall testing device and method for large-size long-strip-shaped semiconductor sample

The invention discloses a Hall testing device and method for a large-size long-strip-shaped semiconductor sample. The Hall testing device is composed of a current loading gating device, a testing cable, a fixing support, a Dewar, a vertical lifting device and a magnetic field loading device. The met...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	RUI HONGMING, KONG JINCHENG, LI JUN, NING ZHUO, LI DONGSHENG, CHEN SHAN, YANG YAN, PENG MANZE, CONG SHUREN, YAN SHUNYING, LI PEI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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