Test data screening method and system
The invention discloses a test data screening method and system. The method comprises the following steps: obtaining function feature information; performing feature traversal comparison on the to-be-tested database according to the function feature information to obtain a comparison result, includi...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a test data screening method and system. The method comprises the following steps: obtaining function feature information; performing feature traversal comparison on the to-be-tested database according to the function feature information to obtain a comparison result, including first function information, second function information, until Nth function information, N being a positive integer; obtaining first function path information according to the first function information; screening from the to-be-tested database according to the first function information and the first function path information to obtain first test data; obtaining second function path information to Nth function path information according to the second function information to the Nth function information in sequence; and screening from the to-be-tested database based on the function information and the function path information to obtain second test data and Nth test data. The technical effects that the test data |
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