Novel microwave probe contact piece and manufacturing method thereof

Novel microwave probe contact piece and manufacturing method thereof

The invention discloses a novel microwave probe contact piece and a manufacturing method thereof, the contact piece comprises a plurality of split contact pieces which are installed at the front end of a coaxial cable and are arranged in parallel, the bottom surface of the front end part of each con...

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Hauptverfasser: LU BO, SANG JINZHENG, SONG ZHENGUO, GE XINLING, FU YANXIN, WANG BIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator LU BO
SANG JINZHENG
SONG ZHENGUO
GE XINLING
FU YANXIN
WANG BIN
description The invention discloses a novel microwave probe contact piece and a manufacturing method thereof, the contact piece comprises a plurality of split contact pieces which are installed at the front end of a coaxial cable and are arranged in parallel, the bottom surface of the front end part of each contact piece is an elliptical cambered surface, and the top surface of the front end part of each contact piece is an inward concave inclined surface. According to the novel microwave probe contact piece disclosed by the invention, the contact surface is changed from a plane to an elliptical arc surface, so that the sliding friction force generated when the contact surface is in contact with a bare chip bonding pad is reduced, and the damage to the bare chip bonding pad is small; the top end of the contact surface provided by the invention only needs one inclined surface to be processed and formed, the processing difficulty and the processing cost are greatly reduced, and the inclined surface is arranged on the back
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113447680A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113447680A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113447680A3</originalsourceid><addsrcrecordid>eNrjZHDxyy9LzVHIzUwuyi9PLEtVKCjKT0pVSM7PK0lMLlEoyExNTlVIzEtRyE3MK00DCpUWZealK-SmlmTkpyiUZKQWpean8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0NjExNzMwsDR2Ni1AAA2JozHw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Novel microwave probe contact piece and manufacturing method thereof</title><source>esp@cenet</source><creator>LU BO ; SANG JINZHENG ; SONG ZHENGUO ; GE XINLING ; FU YANXIN ; WANG BIN</creator><creatorcontrib>LU BO ; SANG JINZHENG ; SONG ZHENGUO ; GE XINLING ; FU YANXIN ; WANG BIN</creatorcontrib><description>The invention discloses a novel microwave probe contact piece and a manufacturing method thereof, the contact piece comprises a plurality of split contact pieces which are installed at the front end of a coaxial cable and are arranged in parallel, the bottom surface of the front end part of each contact piece is an elliptical cambered surface, and the top surface of the front end part of each contact piece is an inward concave inclined surface. According to the novel microwave probe contact piece disclosed by the invention, the contact surface is changed from a plane to an elliptical arc surface, so that the sliding friction force generated when the contact surface is in contact with a bare chip bonding pad is reduced, and the damage to the bare chip bonding pad is small; the top end of the contact surface provided by the invention only needs one inclined surface to be processed and formed, the processing difficulty and the processing cost are greatly reduced, and the inclined surface is arranged on the back</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210928&amp;DB=EPODOC&amp;CC=CN&amp;NR=113447680A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210928&amp;DB=EPODOC&amp;CC=CN&amp;NR=113447680A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LU BO</creatorcontrib><creatorcontrib>SANG JINZHENG</creatorcontrib><creatorcontrib>SONG ZHENGUO</creatorcontrib><creatorcontrib>GE XINLING</creatorcontrib><creatorcontrib>FU YANXIN</creatorcontrib><creatorcontrib>WANG BIN</creatorcontrib><title>Novel microwave probe contact piece and manufacturing method thereof</title><description>The invention discloses a novel microwave probe contact piece and a manufacturing method thereof, the contact piece comprises a plurality of split contact pieces which are installed at the front end of a coaxial cable and are arranged in parallel, the bottom surface of the front end part of each contact piece is an elliptical cambered surface, and the top surface of the front end part of each contact piece is an inward concave inclined surface. According to the novel microwave probe contact piece disclosed by the invention, the contact surface is changed from a plane to an elliptical arc surface, so that the sliding friction force generated when the contact surface is in contact with a bare chip bonding pad is reduced, and the damage to the bare chip bonding pad is small; the top end of the contact surface provided by the invention only needs one inclined surface to be processed and formed, the processing difficulty and the processing cost are greatly reduced, and the inclined surface is arranged on the back</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDxyy9LzVHIzUwuyi9PLEtVKCjKT0pVSM7PK0lMLlEoyExNTlVIzEtRyE3MK00DCpUWZealK-SmlmTkpyiUZKQWpean8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_Q0NjExNzMwsDR2Ni1AAA2JozHw</recordid><startdate>20210928</startdate><enddate>20210928</enddate><creator>LU BO</creator><creator>SANG JINZHENG</creator><creator>SONG ZHENGUO</creator><creator>GE XINLING</creator><creator>FU YANXIN</creator><creator>WANG BIN</creator><scope>EVB</scope></search><sort><creationdate>20210928</creationdate><title>Novel microwave probe contact piece and manufacturing method thereof</title><author>LU BO ; SANG JINZHENG ; SONG ZHENGUO ; GE XINLING ; FU YANXIN ; WANG BIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113447680A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LU BO</creatorcontrib><creatorcontrib>SANG JINZHENG</creatorcontrib><creatorcontrib>SONG ZHENGUO</creatorcontrib><creatorcontrib>GE XINLING</creatorcontrib><creatorcontrib>FU YANXIN</creatorcontrib><creatorcontrib>WANG BIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LU BO</au><au>SANG JINZHENG</au><au>SONG ZHENGUO</au><au>GE XINLING</au><au>FU YANXIN</au><au>WANG BIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Novel microwave probe contact piece and manufacturing method thereof</title><date>2021-09-28</date><risdate>2021</risdate><abstract>The invention discloses a novel microwave probe contact piece and a manufacturing method thereof, the contact piece comprises a plurality of split contact pieces which are installed at the front end of a coaxial cable and are arranged in parallel, the bottom surface of the front end part of each contact piece is an elliptical cambered surface, and the top surface of the front end part of each contact piece is an inward concave inclined surface. According to the novel microwave probe contact piece disclosed by the invention, the contact surface is changed from a plane to an elliptical arc surface, so that the sliding friction force generated when the contact surface is in contact with a bare chip bonding pad is reduced, and the damage to the bare chip bonding pad is small; the top end of the contact surface provided by the invention only needs one inclined surface to be processed and formed, the processing difficulty and the processing cost are greatly reduced, and the inclined surface is arranged on the back</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Novel microwave probe contact piece and manufacturing method thereof
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T05%3A53%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LU%20BO&rft.date=2021-09-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113447680A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true