Novel microwave probe contact piece and manufacturing method thereof

The invention discloses a novel microwave probe contact piece and a manufacturing method thereof, the contact piece comprises a plurality of split contact pieces which are installed at the front end of a coaxial cable and are arranged in parallel, the bottom surface of the front end part of each contact piece is an elliptical cambered surface, and the top surface of the front end part of each contact piece is an inward concave inclined surface. According to the novel microwave probe contact piece disclosed by the invention, the contact surface is changed from a plane to an elliptical arc surface, so that the sliding friction force generated when the contact surface is in contact with a bare chip bonding pad is reduced, and the damage to the bare chip bonding pad is small; the top end of the contact surface provided by the invention only needs one inclined surface to be processed and formed, the processing difficulty and the processing cost are greatly reduced, and the inclined surface is arranged on the back