High-voltage MIS-HEMT device with composite layer structure
The invention provides a high-voltage MIS-HEMT device with a composite layer structure, which comprises a substrate, an AlxGa1-xN layer arranged on the substrate and intentionally doped with P-type impurities, an unintentionally doped GaN layer arranged on the AlxGa1-xN layer, a drain electrode arra...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a high-voltage MIS-HEMT device with a composite layer structure, which comprises a substrate, an AlxGa1-xN layer arranged on the substrate and intentionally doped with P-type impurities, an unintentionally doped GaN layer arranged on the AlxGa1-xN layer, a drain electrode arranged on the surface of the GaN layer and an unintentionally doped stripe-shaped AlyGa1-yN layer, x |
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