Processing method and device for eliminating noise characteristics of electric imaging image
The embodiment of the invention discloses a processing method and device for eliminating noise characteristics of an electric imaging image. The method comprises the following steps: selecting a sample image meeting a sample condition from the electric imaging image; extracting electric buckle measu...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention discloses a processing method and device for eliminating noise characteristics of an electric imaging image. The method comprises the following steps: selecting a sample image meeting a sample condition from the electric imaging image; extracting electric buckle measurement data of the sample image to perform statistical processing so as to determine a boundary value of background data and specified feature data in the sample image; dividing a background data area and a specified feature data area in the electric imaging image according to the boundary value and the electric deduction measurement data of the electric imaging image, and performing binarization processing on the electric deduction measurement data of the electric imaging image according to the boundary value to obtain electric deduction binarization data corresponding to the background data and the specified feature data; performing connectivity detection on the electric buckle binary data of the electric imaging |
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