Test fixture, power supply test system and test method

An embodiment of the invention discloses a test fixture, which comprises a first connection pin which is connected with a second connection pin through an impedance assembly, wherein the first connection pin is used for being connected with a controlled pin of a power adapter to be tested; the second connecting pin is used for being connected with a power supply output pin of a power supply; and the impedance assembly has first impedance in a direction in which a current flows from the first connection pin to the second connection pin, and has second impedance in a direction in which a current flows from the second connection pin to the first connection pin, and the first impedance is greater than the second impedance. The embodiment of the invention further discloses a power supply test system and a test method. 本发明实施例公开了一种测试治具，所述治具包括：所述第一连接引脚，通过所述阻抗组件与所述第二连接引脚连接；所述第一连接引脚，用于与待测电源适配器的受控引脚连接；所述第二连接引脚，用于与供电电源的电源输出引脚连接；所述阻抗组件，在电流从所述第一连接引脚连接流向所述第二连接引脚的方向上具有第一阻抗，在电流从所述第二连接引脚连接流向所述第一连接引脚的方向上具有第二阻抗，其中，所述第一阻抗大于所述第二阻抗