Transparent plate point defect detection system and method

The invention discloses a transparent plate point defect detection system, which is characterized in that two point light sources are used for irradiating point defects in a transparent plate, and two projection patterns of the point defects can be formed on a projection screen, so that an image sho...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZONG ZISHENG, ZONG ZIKAI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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