Transparent plate point defect detection system and method

The invention discloses a transparent plate point defect detection system, which is characterized in that two point light sources are used for irradiating point defects in a transparent plate, and two projection patterns of the point defects can be formed on a projection screen, so that an image sho...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ZONG ZISHENG, ZONG ZIKAI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a transparent plate point defect detection system, which is characterized in that two point light sources are used for irradiating point defects in a transparent plate, and two projection patterns of the point defects can be formed on a projection screen, so that an image shot by a camera can comprise a point defect pattern group, and the point defect image group comprises a real image pattern formed by the point defects and two corresponding projection patterns. When the position of the point light sources is fixed, the distance between the projection patterns corresponds to the depth of the point defects. And the depth of the point defects can be determined by measuring the distance between the projection patterns, so that the point defects in the transparent plate can be quickly positioned. The invention further provides a method for detecting the point defects of the transparent plate, and the method also has the above beneficial effects. 本发明公开了一种透明板材点状缺陷检测系统,通过两个点光源照射透明板材中的点缺陷,可以在