Nondestructive testing device and method for internal stress of X-rays with short wavelength characteristics

The invention discloses a nondestructive testing device for internal stress of X-rays with short wavelength characteristics. The nondestructive testing device comprises an X-ray source, an incidence collimator of the X-ray source, an angular instrument, a sample holder, at least two detectors, a rec...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHENG LIN, CHE LUCHANG, CHEN XIN, WANG CHENGZHANG, DOU SHITAO, FENG XIANHE, HE CHANGGUANG, ZHANG JIN, PENG ZHENGKUN, ZHANG LUNWU, ZHOU KUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE PHYSICS TESTING
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