Nondestructive testing device and method for internal stress of X-rays with short wavelength characteristics

The invention discloses a nondestructive testing device for internal stress of X-rays with short wavelength characteristics. The nondestructive testing device comprises an X-ray source, an incidence collimator of the X-ray source, an angular instrument, a sample holder, at least two detectors, a receiving collimator group of the detectors and the like, wherein the detectors and the receiving collimators corresponding to the detectors are fixedly connected with a detector support, the detectors and the receiving collimators are in one-to-one correspondence, and the angular instrument drives the detectors and the receiving collimators corresponding to the detectors to rotate; the receiving port of each detector points to the exit port of the corresponding receiving collimator, and the receiving port of the receiving collimator points to the center of the circle of the diffractometer. In the using process, the positions of the receiving collimators and the detectors can be adjusted, so that different angles are