Method and device for quantitative analysis of uncertainty of structural damage identification

The invention discloses a method and device for quantitative analysis of uncertainty of structural damage identification. The method comprises the following steps: establishing a finite element model of a structure, and obtaining calculation feature data of the structure according to the finite elem...

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Hauptverfasser: LYU ZHONGRONG, LIU JIKE, WANG LI, YIN ZHIYI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method and device for quantitative analysis of uncertainty of structural damage identification. The method comprises the following steps: establishing a finite element model of a structure, and obtaining calculation feature data of the structure according to the finite element model; constructing a target function by adopting a Tikhonov regularization method in combination with the calculation feature data of the structure and the actual measurement feature data of the structure; solving the objective function by adopting a sensitivity method to obtain an optimal damage parameter and a covariance matrix of the damage parameter; and carrying out uncertainty quantitative analysis according to the optimal damage parameter and the covariance matrix of the damage parameter to obtain an analysis result. According to the method and device, the uncertainty of the quantitative recognition result can be realized through low-complexity calculation. 本发明公开了一种结构损伤识别的不确定性定量分析方法及装置。所述方法,包括:建立结构的有限元模