Dynamic mechanical property detection method and device for conductor material
The invention discloses a dynamic mechanical property detection method and device for a conductor material, and belongs to the field of electromagnetic detection. The method comprises the steps that S1, a conductor ring arranged in a transient magnetic field and processed from the conductor material...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses a dynamic mechanical property detection method and device for a conductor material, and belongs to the field of electromagnetic detection. The method comprises the steps that S1, a conductor ring arranged in a transient magnetic field and processed from the conductor material expands outwards under the action of electromagnetic induction, wherein the conductivity of the conductor material is greater than a preset value; S2, the ring inner side stress sigma 1 at the widest position and the ring outer side stress sigma 2 at the widest position in the conductor ring in the outward expansion process are obtained; and S3, the ring inner side stress sigma3 at the narrowest part in the conductor ring is calculated by using the ring inner side stress sigma1 at the widest part and the ring outer side stress sigma2 at the widest part, and a mapping relation between the ring inner side stress sigma3 at the narrowest part and the strain epsilon3 at the narrowest part is calculated so as to represe |
---|