METHOD AND ARRANGEMENT FOR DETERMINING ELECTROMAGNETIC COMPATIBILITY (EMC) OF TECHNICAL SYSTEM
The invention relates to a method for determining the electromagnetic compatibility (EMC) of a technical system. The method comprises specifying at least one influencing variable of the technical system, wherein the influencing variable has a potential influence on the EMC of the technical system; d...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The invention relates to a method for determining the electromagnetic compatibility (EMC) of a technical system. The method comprises specifying at least one influencing variable of the technical system, wherein the influencing variable has a potential influence on the EMC of the technical system; determining at least one EMC outcome variable of the technical system on the basis of a variation of the influencing variable. The invention further relates to an arrangement (200) for determining the electromagnetic compatibility (EMC) of the technical system, and the arrangement (200) comprises an input device (210) by means of which a user can specify at least one influencing variable of the technical system, wherein the influencing variable has a potential influence on the EMC of the technical system; a computing device (220) which is designed to determine at least one EMC outcome variable of the technical system on the basis of a variation of the influencing variable.
本发明涉及一种用于确定技术系统的电磁兼容性（EMV）的方法，包括：-预给定技术系统的至 |
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