Quantitative evaluation method for non-uniform etching degree of acid etching crack

The invention relates to a quantitative evaluation method for the non-uniform etching degree of an acid etching crack, which belongs to the technical field of acidification and acid fracturing of oil and gas field reservoir transformation. The quantitative evaluation method mainly comprises the foll...

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Hauptverfasser: DENG DAWEI, QI NING, HE LONG, LI YITIAN, YANG XIAO, HAN ZIZHAO, JIANG PING, SU XUHANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a quantitative evaluation method for the non-uniform etching degree of an acid etching crack, which belongs to the technical field of acidification and acid fracturing of oil and gas field reservoir transformation. The quantitative evaluation method mainly comprises the following four parts of extracting core point cloud data before and after acid etching, superposing models before and after digital processing of acid etching, extracting surface topography characteristic parameters, and calculating a non-uniform etching coefficient. The quantitative evaluation method is implemented by selecting an expansion interface coefficient in the horizontal direction and an acid etching height standard deviation coefficient in the vertical direction according to the surface topography characteristic parameters, and adding the expansion interface coefficient and the acid etching height standard deviation coefficient to calculate a non-uniform etching coefficient, wherein the weights of the expans