Method for improving cut stem yield

The invention provides a method for improving the cut stem yield. The method comprises the steps: determining main influence factors influencing the cut stem yield in production, carrying out the cause collection through an SIPOC model diagram, forming an FEMA table, carrying out the first-time cause screening through FEMA, and screening out potential failure causes with the score higher than 120 according to the RPN risk number; performing secondary screening by adopting a causal matrix, and performing weight assignment and analysis of influence factors on the collected reasons according to a program of the causal matrix; screening the process input variables again according to the result of the causal matrix table and the overall calculation percentage, and finally determining the input variables needing to be improved; and aiming at each influence factor, determining and selecting a standard and a standard weight of an improvement measure from management reasons, and searching reasonable parameter matching