Semiconductor device

The application discloses a semiconductor device, comprising: a cavity, an infrared temperature measurement sensor, a temperature measuring turntable and a transmission device; the top of which is provided with a first temperature measurement window; the infrared temperature measurement sensor is lo...

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Bibliographische Detailangaben
1. Verfasser:	QIAO JIANDONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE APPARATUS THEREFOR BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL COLORIMETRY CRYSTAL GROWTH DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING METALLURGY PHYSICS PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE RADIATION PYROMETRY REFINING BY ZONE-MELTING OF MATERIAL SEMICONDUCTOR DEVICES SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE SINGLE-CRYSTAL-GROWTH SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION TESTING UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
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Beschreibung
Zusammenfassung:	The application discloses a semiconductor device, comprising: a cavity, an infrared temperature measurement sensor, a temperature measuring turntable and a transmission device; the top of which is provided with a first temperature measurement window; the infrared temperature measurement sensor is located outside the cavity, and the temperature measurement end of the infrared temperature measurement sensor faces the first temperature measurement window; the temperature measuring turntable is positioned in the cavity and is fixedly arranged with the top of the cavity, and the temperature measuring turntable is provided with at least two second temperature measuring windows; the transmission device is connected with the temperature measuring rotary table and used for driving the temperature measuring rotary table to rotate, rotating one of the at least two second temperature measuring windows to the position below the first temperature measuring window and enabling the second temperature measuring window to be l