Multichannel testing device applied to probe station

The invention relates to a multichannel testing device applied to a probe station. The device comprises a working table, a microscope displacement table is arranged on the table top of the working table, and a probe card overturning displacement table and a wafer chuck mechanism are arranged in a working cavity in the working table; the microscope displacement table comprises a three-axis displacement assembly, and a microscope mechanism is arranged at the front end of the three-axis displacement assembly; the probe card overturning displacement table comprises a probe card Y-axis displacement assembly and a plurality of probe card X-axis displacement assemblies; the plurality of probe card X-axis displacement assemblies are arranged on the probe card Y-axis displacement assembly in a sliding manner through a probe card overturning mechanism; a plurality of probe card mechanisms are arranged on the plurality of probe card X-axis displacement assemblies in a sliding manner, and each probe card mechanism compri