Tire X-ray image impurity defect detection method

The invention relates to a tire X-ray image impurity defect detection method. The method comprises the following steps: S1, establishing an image data set containing impurity defects; s2, enhancing the data set by using rotation, mirroring and brightness transformation; s3,building an improved YOLOv...

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Hauptverfasser: SUN YINGWEI, ZHENG ZHOUZHOU, ZHANG YAN, CHANG YANKANG, ZHAO MENGMENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a tire X-ray image impurity defect detection method. The method comprises the following steps: S1, establishing an image data set containing impurity defects; s2, enhancing the data set by using rotation, mirroring and brightness transformation; s3,building an improved YOLOv4-tiny network; s4, setting hyper-parameters and network parameters for training; s5, inputting a to-be-detected image to carry out defect detection. According to the invention, end-to-end tire impurity defect positioning is realized, the requirement of real-time tire defect detection can be met, and the production efficiency is greatly improved. 本发明涉及轮胎X射线图像杂质缺陷检测方法,其包括以下步骤S1:建立包含杂质缺陷的图像数据集;S2:使用旋转、镜像和亮度变换对数据集进行了增强;S3:搭建改进的YOLOv4-tiny网络;S4:设置超参数和网络参数进行训练;S5:输入待检测图像进行缺陷检测;本发明实现了端到端的轮胎杂质缺陷定位,能够满足轮胎缺陷实时检测的需求,极大提高了生产效率。