METHOD OF DETECTING CONCEALED PATTERN

A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optiona...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: GALVAN-MIYOSHI JULIAN M, BROWN ZAC J, OLIVARES LECONA JOSE ALBERTO, MORONES DOBARGANES ALEJANDRO, CHORENO JUAN F, DUARTE NICHOLAS B, LAIRD DARIN W
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength. 一种检测包含隐藏图案的部件的方法包含:检测由包含第一图案的部件反射或发射的红外电磁辐射,所述部件包含:衬底;第一图案,设置在衬底的至少一部分之上;任选的底漆层,设置在衬底的至少一部分和第一图案的至少一部分之间;和包含红外透明颜料的第一可见不透明层,所述第一可见不透明层设置在第一图案的至少一部分之上;和将第一图案在一个波长下对红外电磁辐射的反射率和/或吸收率与底漆层和/或衬底在相同波长下的反射率和/或吸收率进行比较。