Semiconductor structure and method of forming integrated circuit structure
The present disclosure provides one embodiment of a semiconductor structure. The semiconductor structure includes a substrate having a front side and a back side; a gate stack formed on the front side of the substrate and disposed on an active region of the substrate; a first source/drain part forme...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The present disclosure provides one embodiment of a semiconductor structure. The semiconductor structure includes a substrate having a front side and a back side; a gate stack formed on the front side of the substrate and disposed on an active region of the substrate; a first source/drain part formed on the active region and disposed at an edge of the gate stack; a backside power rail formed on the back side of the substrate; and a backside contact part interposed between a backside power rail and the first source/drain part, and electrically connecting the backside power rail to the first source/drain part. The backside contact part further includes a first silicide layer on the back side of the substrate. Embodiments of the invention also relate to a method of forming an integrated circuit structure.
本公开提供了一种半导体结构的实施例。半导体结构包括:衬底,具有前侧和背侧;栅极堆叠件,形成在衬底的前侧上,并且设置在衬底的有源区上;第一源极/漏极部件,形成在有源区上并且设置在栅极堆叠件的边缘处;背侧电源轨,形成在衬底的背侧上;背侧接触部件,插入在背侧电源轨和第一源极/漏极部件之间,并且将背侧电源轨电连接到第一源极/漏极部件。背侧接触部件还包括设置在衬底的背侧上的第一硅化物层。本发明的实施例还涉及形成集成电路结构的方 |
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