Impedance measuring method
The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value,...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HUANG ZHIZHONG TONG HENGJIN DU JIAHAO WU JIANMING |
| description | The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value, and a second test module measures the current flowing through the to-be-tested assembly to obtain a first current value. In a second mode, power is supplied to the second end of the to-be-tested assembly, the second test module measures the cross voltage of the to-be-tested assembly to obtain a second voltage value, and the first test module measures the current flowing through the to-be-tested assembly to obtain a second current value. According to the first voltage value, the second voltage value, the first current value and the second current value, a real impedance value of the to-be-tested assembly is calculated.
本申请提供一种阻抗量测方法，应用于量测待测组件。于第一模式中，供电给待测组件的第一端，且由第一测试模块量测待测组件的跨电压以取得第一电压值，再由第二测试模块量测流经待测组件的电流以取得第一电流值。 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113009223A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113009223A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113009223A3</originalsourceid><addsrcrecordid>eNrjZJDyzC1ITUnMS05VyE1NLC4tysxLB7JKMvJTeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoaGxgYGlkZGxozExagBOESL9</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Impedance measuring method</title><source>esp@cenet</source><creator>HUANG ZHIZHONG ; TONG HENGJIN ; DU JIAHAO ; WU JIANMING</creator><creatorcontrib>HUANG ZHIZHONG ; TONG HENGJIN ; DU JIAHAO ; WU JIANMING</creatorcontrib><description>The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value, and a second test module measures the current flowing through the to-be-tested assembly to obtain a first current value. In a second mode, power is supplied to the second end of the to-be-tested assembly, the second test module measures the cross voltage of the to-be-tested assembly to obtain a second voltage value, and the first test module measures the current flowing through the to-be-tested assembly to obtain a second current value. According to the first voltage value, the second voltage value, the first current value and the second current value, a real impedance value of the to-be-tested assembly is calculated.
本申请提供一种阻抗量测方法，应用于量测待测组件。于第一模式中，供电给待测组件的第一端，且由第一测试模块量测待测组件的跨电压以取得第一电压值，再由第二测试模块量测流经待测组件的电流以取得第一电流值。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210622&DB=EPODOC&CC=CN&NR=113009223A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210622&DB=EPODOC&CC=CN&NR=113009223A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG ZHIZHONG</creatorcontrib><creatorcontrib>TONG HENGJIN</creatorcontrib><creatorcontrib>DU JIAHAO</creatorcontrib><creatorcontrib>WU JIANMING</creatorcontrib><title>Impedance measuring method</title><description>The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value, and a second test module measures the current flowing through the to-be-tested assembly to obtain a first current value. In a second mode, power is supplied to the second end of the to-be-tested assembly, the second test module measures the cross voltage of the to-be-tested assembly to obtain a second voltage value, and the first test module measures the current flowing through the to-be-tested assembly to obtain a second current value. According to the first voltage value, the second voltage value, the first current value and the second current value, a real impedance value of the to-be-tested assembly is calculated.
本申请提供一种阻抗量测方法，应用于量测待测组件。于第一模式中，供电给待测组件的第一端，且由第一测试模块量测待测组件的跨电压以取得第一电压值，再由第二测试模块量测流经待测组件的电流以取得第一电流值。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJDyzC1ITUnMS05VyE1NLC4tysxLB7JKMvJTeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoaGxgYGlkZGxozExagBOESL9</recordid><startdate>20210622</startdate><enddate>20210622</enddate><creator>HUANG ZHIZHONG</creator><creator>TONG HENGJIN</creator><creator>DU JIAHAO</creator><creator>WU JIANMING</creator><scope>EVB</scope></search><sort><creationdate>20210622</creationdate><title>Impedance measuring method</title><author>HUANG ZHIZHONG ; TONG HENGJIN ; DU JIAHAO ; WU JIANMING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113009223A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG ZHIZHONG</creatorcontrib><creatorcontrib>TONG HENGJIN</creatorcontrib><creatorcontrib>DU JIAHAO</creatorcontrib><creatorcontrib>WU JIANMING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG ZHIZHONG</au><au>TONG HENGJIN</au><au>DU JIAHAO</au><au>WU JIANMING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Impedance measuring method</title><date>2021-06-22</date><risdate>2021</risdate><abstract>The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value, and a second test module measures the current flowing through the to-be-tested assembly to obtain a first current value. In a second mode, power is supplied to the second end of the to-be-tested assembly, the second test module measures the cross voltage of the to-be-tested assembly to obtain a second voltage value, and the first test module measures the current flowing through the to-be-tested assembly to obtain a second current value. According to the first voltage value, the second voltage value, the first current value and the second current value, a real impedance value of the to-be-tested assembly is calculated.
本申请提供一种阻抗量测方法，应用于量测待测组件。于第一模式中，供电给待测组件的第一端，且由第一测试模块量测待测组件的跨电压以取得第一电压值，再由第二测试模块量测流经待测组件的电流以取得第一电流值。</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN113009223A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Impedance measuring method |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T17%3A30%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20ZHIZHONG&rft.date=2021-06-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113009223A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |