Impedance measuring method
The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value,...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides an impedance measuring method which is applied to measuring a to-be-measured component. In a first mode, power is supplied to the first end of a to-be-tested assembly, a first test module measures the cross voltage of the to-be-tested assembly to obtain a first voltage value, and a second test module measures the current flowing through the to-be-tested assembly to obtain a first current value. In a second mode, power is supplied to the second end of the to-be-tested assembly, the second test module measures the cross voltage of the to-be-tested assembly to obtain a second voltage value, and the first test module measures the current flowing through the to-be-tested assembly to obtain a second current value. According to the first voltage value, the second voltage value, the first current value and the second current value, a real impedance value of the to-be-tested assembly is calculated.
本申请提供一种阻抗量测方法,应用于量测待测组件。于第一模式中,供电给待测组件的第一端,且由第一测试模块量测待测组件的跨电压以取得第一电压值,再由第二测试模块量测流经待测组件的电流以取得第一电流值。 |
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