Inter-system measurement method and device
The invention provides an inter-system measurement method and device. The method comprises the following steps: acquiring a to-be-processed frequency point from a frequency point scheduling queue, wherein the frequency point scheduling queue comprises a plurality of pre-configured frequency points;...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides an inter-system measurement method and device. The method comprises the following steps: acquiring a to-be-processed frequency point from a frequency point scheduling queue, wherein the frequency point scheduling queue comprises a plurality of pre-configured frequency points; if the to-be-processed frequency point is the last frequency point in the frequency point scheduling queue, and the scheduling times of the to-be-processed frequency point and a preset frequency point sorting period meet a preset condition, based on a measurement result of each frequency point in the frequency point scheduling queue and/or a first cell search ICS result, updating the sequence of each frequency point in the frequency point scheduling queue; and performing measurement or ICS on the frequency points in the updated frequency point scheduling queue. According to the invention, the UE can generate the measurement report in a short time and report the measurement report to the gNodeB, so that the UE is ra |
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