Method for screening wheat cold resistance evaluation indexes by using chlorophyll fluorescence and application

The invention belongs to the technical field of agriculture, and discloses a method for screening wheat cold resistance evaluation indexes by using chlorophyll fluorescence. The method includes the following steps: obtaining a wheat leaf frostbite rate and a chlorophyll fluorescence induction kineti...

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Hauptverfasser: SHAO YUNHUI, YANG CHENG, DU SIMENG, SHI YANHUA, CHENG HONGJIAN, YAN GE, ZHANG DEQI, FANG BAOTING, JIN HAIYANG, LI XIANGDONG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention belongs to the technical field of agriculture, and discloses a method for screening wheat cold resistance evaluation indexes by using chlorophyll fluorescence. The method includes the following steps: obtaining a wheat leaf frostbite rate and a chlorophyll fluorescence induction kinetics curve; obtaining a plurality of chlorophyll fluorescence induction kinetic parameters according to the chlorophyll fluorescence induction kinetic curve; performing correlation analysis on each chlorophyll fluorescence induction kinetic parameter and the freezing injury rate, and selecting the chlorophyll fluorescence induction kinetic parameter with the highest correlation with the wheat freezing injury as an evaluation index for measuring the wheat cold resistance. According to the method, chlorophyll fluorescence induced kinetic parameters with the highest correlation with wheat freezing injury are screened out to serve as evaluation indexes for measuring wheat cold resistance, then wheat cold-resistant variet