Atomic layer deposition chamber with funnel-shaped gas dispersion channel and gas distribution plate

Methods and apparatus for processing a substrate are provided herein. In some embodiments, a substrate processing chamber includes: a chamber body; a chamber lid assembly having a housing enclosing a central channel that extends along a central axis and has an upper portion and a lower portion; a li...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SANCHEZ MARIO DAN, JIAN GUOQIANG, JADHAV DEEPAK, AGARWAL ASHUTOSH, GANDIKOTA SRINIVAS, YANG YIXIONG, RASHEED MUHAMMAD M
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Methods and apparatus for processing a substrate are provided herein. In some embodiments, a substrate processing chamber includes: a chamber body; a chamber lid assembly having a housing enclosing a central channel that extends along a central axis and has an upper portion and a lower portion; a lid plate coupled to the housing and having a contoured bottom surface that extends downwardly and outwardly from a central opening coupled to the lower portion of the central channel to a peripheral portion of the lid plate; and a gas distribution plate disposed below the lid plate and having a plurality of apertures disposed through the gas distribution plate. 本文提供用于处理基板的方法与设备。一些实施方式中,基板处理腔室包含:腔室主体;腔室盖组件,所述腔室盖组件具有外壳(housing),所述外壳包围中央通道,所述中央通道沿着中央轴延伸并具有上部与下部;盖板,所述盖板耦接于所述外壳并具有含轮廓(contoured)的底表面,所述含轮廓的底表面从中央开口向下且向外延伸至所述盖板的周边部,所述中央开口耦接于所述中央通道的下部;以及气体分配板,所述气体分配板配置于所述盖板之下并具有多个缝隙(aperture),这些缝隙穿过所述气体分配板而配置。