AD chip testing device and testing method thereof

The invention discloses an AD chip testing device and a testing method thereof, and aims to solve technical problems of low AD chip testing efficiency, difficulty in chip disassembly and assembly and easiness in repeated testing in the prior art. The method comprises the following steps: outputting analog quantity signals with different frequencies and different amplitudes according to a control signal; enabling an AD chip to carry out data conversion on the analog quantity signals to obtain a measurement analog quantity, and enabling the AD chip to obtain a null drift signal; and calculating a chip measurement error and a null drift value according to the analog quantity signals, the measurement analog quantity and the null drift signal, and performing fault AD chip screening. According to the invention, AD chip testing can be automatically carried out, the testing efficiency is high, the speed is high, and rapid and accurate AD chip screening is realized. 本发明公开了一种AD芯片测试装置及其测试方法，旨在解决现有技术中AD芯片测试效率低、芯片拆装困难、容易重