METHOD TO CORRECT ION SOURCE INEFFICIENCIES MAKES SAMPLE-TO-SAMPLE NORMALIZATION POSSIBLE

In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that onc...

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Bibliographische Detailangaben

Hauptverfasser:	DE JONG FELICE, BEECHER CHRISTOPHER WILLAM WARD
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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