Image feature rapid extraction method based on auxiliary mark points

The invention belongs to the technical field of optical measurement, and particularly relates to an image feature rapid extraction method based on auxiliary mark points, which comprises the steps of acquiring an image of a measured object with auxiliary marks, establishing a laser light bar section...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG TENGSEN, WANG HUIHUI, GAO SONG, WANG PENG, LYU QINGJIA, LIU YANG, LYU YAN, WANG CAIHONG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention belongs to the technical field of optical measurement, and particularly relates to an image feature rapid extraction method based on auxiliary mark points, which comprises the steps of acquiring an image of a measured object with auxiliary marks, establishing a laser light bar section gray scale distribution model, rapidly positioning feature points, performing high-precision extraction on the feature points and the like. The image feature rapid extraction method based on the auxiliary mark points solves the problems that effective features of the surface of a complex object are difficult to extract, precision and efficiency are difficult to consider at the same time, real-time performance is poor, and other feature information is effectively extracted. According to the method, the connection relationship between the adjacent grid intersection points is fully utilized, and the fitting process of the grid intersection points to be extracted is constrained through the surrounding adjacent intersec