Infrared thermal image-based external wall external thermal insulation system defect identification and damage degree evaluation method

The invention relates to an an infrared thermal image-based external wall external thermal insulation system defect identification and damage degree evaluation method, in particular to an external wall external thermal insulation system defect identification and damage degree evaluation method. The...

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Bibliographische Detailangaben
Hauptverfasser: YU QINGLIN, MA GUORU, LIANG YIXUN, WANG ZHENG, FENG XIUYAN, LI XIAOXIANG, SHAO LUSHAN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to an an infrared thermal image-based external wall external thermal insulation system defect identification and damage degree evaluation method, in particular to an external wall external thermal insulation system defect identification and damage degree evaluation method. The objective of the invention is to solve the problems of low efficiency and poor accuracy caused by the fact that detection personnel need to participate in detection and judgment during external wall external thermal insulation defect detection in an existing infrared thermal imaging method. The method comprises the following steps: 1, carrying out image denoising processing on an acquired infrared thermogram, converting the denoised image into a grayscale image, and drawing a grayscale histogram; 2, calculating a gray scale gradient of a pixel point in the gray scale image, then carrying out non-maximum suppression, and finally carrying out threshold screening to obtain an edge detection binary image; 3, obtaining