Method and device for determining near-surface azimuth anisotropy speed
The invention discloses a method and device for determining near-surface azimuth anisotropy speed. The method comprises the steps of collecting the seismic data of a to-be-measured region, and picking up the first arrival time according to the seismic data, comparing the first arrival time with a pr...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method and device for determining near-surface azimuth anisotropy speed. The method comprises the steps of collecting the seismic data of a to-be-measured region, and picking up the first arrival time according to the seismic data, comparing the first arrival time with a preset threshold value, and obtaining effective first arrival according to a comparison result, obtaining a corresponding relationship among the common center point, the offset and the azimuth angle through the effective first arrival of the common center point, and grouping the effective first arrival, obtaining the first arrival time of the same refraction layer according to the grouped effective first arrival through the geophone offset, obtaining the geophone offset range through the first arrival time of the same refraction layer, carrying out the speed analysis of different directions, obtaining the refraction speed parameters of different directions, carrying out the five-parameter ellipse fitting of the refra |
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