Error correction method for improving speckle method measurement precision and speckle measurement method

The invention discloses an error correction method for improving the measurement precision of a speckle method and a speckle measurement method, relates to the speckle measurement method, and provides the scheme aiming at the error influence caused by the thickness of a transparent solid in the prio...

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Hauptverfasser: LI JUNHAO, FENG ZUQIANG, LUO JINGMING, XU QINZHAN, ZHOU ROUYAN, DENG DINGNAN, ZHANG HAINING, GU JIAWEI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses an error correction method for improving the measurement precision of a speckle method and a speckle measurement method, relates to the speckle measurement method, and provides the scheme aiming at the error influence caused by the thickness of a transparent solid in the prior art. The method includes following steps: by taking the speckle pattern when the transparent solid is perpendicular to the optical axis as a first speckle pattern, inclining the transparent solid relative to the optical axis and obtaining a second speckle pattern; and finally, extracting speckle pairs from the first speckle pattern and the second speckle pattern and carrying out theoretical calculation on the physical quantity to be measured. The method has the advantages that the thickness attribute is no longer a limiting parameter applied by a speckle method, the method can be directly applied as long as a transparent solid is used in refined measurement to rough measurement, and the application range of the s