Component quality acquisition method and device, computer equipment and storage medium

The invention relates to a component quality obtaining method and device, computer equipment and a storage medium. The method comprises the steps: acquiring impact signals generated when a plurality of to-be-detected components impact a monitoring area, carrying out the wavelet packet decomposition...

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Hauptverfasser: TANG SHUJIAN, WU FENGQI, LU GUANGYAO, YANG JUE, LIU QINGSONG, ZHOU GUOFENG, JU YANNA, WANG YIFU, FENG YONG, ZHOU JIANMING, HAN WANFU, YE LIANG, SHI HONG, ZHANG CHAO, LI QUANZHANG, RUI MIN, QIAO JIANYI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a component quality obtaining method and device, computer equipment and a storage medium. The method comprises the steps: acquiring impact signals generated when a plurality of to-be-detected components impact a monitoring area, carrying out the wavelet packet decomposition to obtain a plurality of frequency bands corresponding to the impact signals, obtaining an energy peak frequency band serial number corresponding to the to-be-detected components based on the frequency bands, and according to the energy peak frequency band serial number and a quality estimation function, obtaining the estimated mass corresponding to the to-be-detected component, and determining the mass corresponding to the to-be-detected component based on the estimated mass and the component masses of the plurality of preset components. Compared with a traditional mode of performing Fourier analysis on an impact signal based on a bending wave generated by part collision or the like, the scheme has the advantages