Component quality acquisition method and device, computer equipment and storage medium
The invention relates to a component quality obtaining method and device, computer equipment and a storage medium. The method comprises the steps: acquiring impact signals generated when a plurality of to-be-detected components impact a monitoring area, carrying out the wavelet packet decomposition...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a component quality obtaining method and device, computer equipment and a storage medium. The method comprises the steps: acquiring impact signals generated when a plurality of to-be-detected components impact a monitoring area, carrying out the wavelet packet decomposition to obtain a plurality of frequency bands corresponding to the impact signals, obtaining an energy peak frequency band serial number corresponding to the to-be-detected components based on the frequency bands, and according to the energy peak frequency band serial number and a quality estimation function, obtaining the estimated mass corresponding to the to-be-detected component, and determining the mass corresponding to the to-be-detected component based on the estimated mass and the component masses of the plurality of preset components. Compared with a traditional mode of performing Fourier analysis on an impact signal based on a bending wave generated by part collision or the like, the scheme has the advantages |
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