Chip system-level test method, device and system

The invention discloses a chip system-level testing method, device and system, and belongs to the technical field of chip testing. The test method comprises the following steps: when a test server receives test demand information of a chip submitted by a user, performing test initialization accordin...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MA YUE, GUI XIAOFENG, XU HONGSI, LI YUFEI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS
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