Chip system-level test method, device and system

The invention discloses a chip system-level testing method, device and system, and belongs to the technical field of chip testing. The test method comprises the following steps: when a test server receives test demand information of a chip submitted by a user, performing test initialization according to the test demand information; powering on a test mainboard on which a chip to be tested is placed on a test host, and receiving chip information returned by the test host; downloading test result data of a previous station corresponding to the chip information from a database according to the chip information, generating customized chip parameters according to the test demand information and the test result data, sending the customized chip parameters to the test host, and writing the customized chip parameters into to-be-tested chips; and when the test server receives test result data fed back by the test host, uploading the test result data to a database, and classifying to-be-tested chips according to the te