Defect detection method and device, electronic equipment and storage medium

The invention provides a defect detection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a first feature map of a template image and a second feature map of a to-be-detected image; for each first feature point in the first feature map, det...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LI CHENG, NIU LINXIAO
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!