Defect detection method and device, electronic equipment and storage medium
The invention provides a defect detection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a first feature map of a template image and a second feature map of a to-be-detected image; for each first feature point in the first feature map, det...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a defect detection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a first feature map of a template image and a second feature map of a to-be-detected image; for each first feature point in the first feature map, determining a plurality of associated feature points from a plurality of first feature points in the first feature map, wherein the distances between the associated feature points and the first feature points meet a preset condition; for each first feature point, performing feature enhancement processing on the first feature point based on the determined similarity between each associated feature point of the first feature point and a target second feature point in a second feature map, wherein thetarget second feature point is a second feature point, matched with the first feature point in position, in a second feature map; and determining a defect detection result corresponding to the to-be-detected image based on t |
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