Defect detection method and device, electronic equipment and storage medium

The invention provides a defect detection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a first feature map of a template image and a second feature map of a to-be-detected image; for each first feature point in the first feature map, det...

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Hauptverfasser: LI CHENG, NIU LINXIAO
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creator LI CHENG
NIU LINXIAO
description The invention provides a defect detection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a first feature map of a template image and a second feature map of a to-be-detected image; for each first feature point in the first feature map, determining a plurality of associated feature points from a plurality of first feature points in the first feature map, wherein the distances between the associated feature points and the first feature points meet a preset condition; for each first feature point, performing feature enhancement processing on the first feature point based on the determined similarity between each associated feature point of the first feature point and a target second feature point in a second feature map, wherein thetarget second feature point is a second feature point, matched with the first feature point in position, in a second feature map; and determining a defect detection result corresponding to the to-be-detected image based on t
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language chi ; eng
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subjects CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
title Defect detection method and device, electronic equipment and storage medium
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