Reliability evaluation method based on two-dimensional array system
The invention provides a reliability evaluation method based on a two-dimensional array system. The method comprises the following steps: step 1, determining a physical arrangement mode of the two-dimensional array system according to a to-be-evaluated system; step 2, numbering all elements in the t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a reliability evaluation method based on a two-dimensional array system. The method comprises the following steps: step 1, determining a physical arrangement mode of the two-dimensional array system according to a to-be-evaluated system; step 2, numbering all elements in the two-dimensional array type system; step 3, determining a failure criterion of the system; step 4, determining the working probability of components a; step 5, calculating the probability that the number of system failure elements in the sub-region does not reach; step 6, calculating the risk of sub-region failure; and step 7, calculating a system reliability index value. According to the method, matrix operation is adopted and is a sparse matrix, so that the calculation speed is high, and a large-scale system can be evaluated; and the reliability of a system formed by heterogeneous components can be evaluated, and engineering requirements are met.
本发明提供一种基于二维阵列系统进行可靠度评估的方法,其包括以下步骤:步骤一,根据待评估系统确定二维阵列型系统的物理排列方式;步骤二,对二维 |
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